Scanning Electron Microscopy (SEM)

Our Hitachi S4000 Field Emission and Jeol JSM-5800 LV Scanning Electron Microscopes (SEM), each equipped with an Energy Dispersive X-ray Microanalysis system (EDS) allow for capturing of high-resolution images up to x200000 in accordance with customer requirements. An extra-large chamber of our Jeol SEM, allows for large objects to be investigated, while its low vacuum (LV) feature allows for observation of very fragile (for instance biological) objects. 

 

A wide range of applications utilizes SEM, partly because of the ease and less destructive nature of sample preparation and unprecedented depth of field, compared to light microscopy. Depending on the task, as-received or specially prepared cross-sectioned samples can be inspected.  

  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy
  • Scanning Electron Microscopy

A few examples of SEM services include failure/root cause analysis; fractography (fracture surface analysis); inspection of the integrity of solder joints; inspection of plating and plating layers; distribution and/or identification of particles; patterning and defect characterization of microelectronic devices and may others. 

What our clients say

  • "SENTEC’s industry knowledge, skills and responsiveness are second to none. It’s been a pleasure working with and learning from SENTEC’s team. When we need skilled micro-sectioning and analyses for electronic parts, SENTEC is our go-to!"

    - Gastops Ltd. Engineering Team

  • "SENTEC has what it takes to get down to the root cause of a problem. We use Science+ENgineering+TEChnology in our business and strongly believe it is the right combination for success."

    - Vladimir Igoshev, Sentec Testing Laboratory Inc.

  • "We have been very happy with the services provided by Sentec. There is excellent knowledge depth for the metallurgical problems associated with electronics manufacturing."

    - Bev Christian, Ph.D

  • "The analysis done by Sentec has been clearly superior to any work done at much larger companies. Their response times is excellent as is their ability to interface with out customers at a very high professional level. It is not uncommon now for your Fortune 100 customers to use SENTEC for other problem solving in lieu of their own internal resources."

    - Steve Kelly, President, PFC Flexible Circuits Limited

  • "The service received from SENTEC has been excellent in terms of responsiveness and technical analysis."

    - Kaspars Friebergs, Director of Quality, EPM Global Services Inc.